Advanced photoelectronic characterization
This system analyzes the processes and limiting factors of performance in mini solar modules and emerging photovoltaic devices. It is based on advanced electrical and opto-electrical characterization techniques, such as electrical impedance spectroscopy, intensity-modulated photocurrent spectroscopy (IMPS/IMVS), and transient photovoltage and photocurrent measurements. These tools identify charge transport, recombination, and degradation mechanisms, providing crucial information for optimizing photovoltaic technologies.
PAIOS
PAIOS evaluates photovoltaic devices over a voltage range of ±12V, current range of ±100 mA, and frequency range of 10 mHz – 10 MHz, offering a comprehensive characterization of solar cell electrical behavior with the capability for JV curve measurement, electrical impedance, capacitance-voltage, IMPS, IMVS, TPC, TPV, OCVD, CELIV, DIT, DLTS, and charge extraction.
Key features include:
- Measurement of opto-electrical parameters and quantum efficiency (EQE).
- Automated system for controlled temperature and humidity testing.
- Evaluation of devices under variable illumination conditions.
- Detailed analysis of charge transport and recombination mechanisms in photovoltaic materials.
- Automated measurement table with high-precision contact probes.
- Thermal control module (-20°C to 80°C) with air cooling and controlled heating.
- Multi-wavelength LED illumination system for spectral efficiency studies.
- Temperature and humidity sensor for characterization under controlled environmental conditions.
- Advanced data analysis and simulation software.